SNE-ALPHA Scanning Electron Microscope

The SNE Alpha desktop scanning electron microscope (SEM) is an advanced instrument that offers the highest imaging performance in its class, with 5 nm resolution and up to x150,000 magnification. Supported by a pre-centered tungsten filament electron gun and an optional Backscattered Electron (BSE) detector in addition to the standard Secondary Electron (SEI) detector, the system offers six-step accelerating voltage range from 1 to 30 kV. Thanks to the user-friendly, next-generation Nano-Eye interface, images are acquired 60% faster than previous models, while advanced automation features (Auto Start, Auto Focus and Auto-Gun-Align) have greatly simplified the processing process. Image stitching technology, which allows combining large areas in a single frame, and 3D rendering support provide superior results in surface roughness analyses. The stage system, which supports samples up to 80 mm in diameter and 40 mm in height, provides flexible sample positioning with 40 mm movement in the X-Y axis, 360° rotation, 0-40 mm Z-axis movement and tilt capability between -45° and +90°. Vacuum control is achieved at the maximum level with high/low vacuum modes and rotary + turbo molecular pump system. The main unit, which is 300 x 460 x 600 mm in size and weighs only 78 kg, offers maximum efficiency in minimum space with its compact design reduced by 40% and can be easily integrated into laboratory environments of all sizes.